Export citation

Export citation

Choose format for download:

Download Citation

    Enhanced low-energy electron emission from superexcited nitrous oxide clusters

    Xuan Yu1,2, Shuncheng Yan1,2, Jianting Lei3, Chenyu Tao1,2, Dongmei Zhao1,2, Ziqi Zhang1,2, Shaofeng Zhang1,2,4,*, and Xinwen Ma1,2,4,†

    • *Contact author: zhangshf@impcas.ac.cn
    • †Contact author: x.ma@impcas.ac.cn

    Phys. Rev. A 113, 013106 – Published 8 January, 2026

    DOI: https://doi.org/10.1103/91vn-bm3b

    Abstract

    Understanding energy relaxation dynamics in weakly bound systems following excitation is fundamental to diverse phenomena, from radiation-induced biological damage to interstellar chemistry. Here, we investigate the photoinduced fragmentation dynamics of both isolated N2O molecules and their molecular clusters using a broadband extreme ultraviolet light source. Beyond direct photoionization processes, we observe indirect ionization pathways that generate low-energy electrons (LEEs) in the 0–10 eV range. This process originates from the population of neutral superexcited states in N2O, followed by either intramolecular autoionization or resonant intermolecular Coulombic decay. In large clusters, we observe a remarkable enhancement of LEE production, with yields becoming comparable to those from direct ionization. Additionally, among all fragmentation products correlated with indirect LEEs, the ionic fragments containing N+ and O+ are significantly reduced, which is in contrast to the situation for isolated N2O molecules. Our observations demonstrate that the decay of superexcited states is significantly influenced by the molecular cluster environment and may extend to the radiation-induced biological damage processes.

    Physics Subject Headings (PhySH)

    Authorization Required

    We need you to provide your credentials before accessing this content.

    References (Subscription Required)

    Outline

    Information

    Sign In to Your Journals Account

    Filter

    Filter

    Article Lookup

    Enter a citation