Demonstration of Robust Chiral Edge Transport in Field-Induced Chern Insulator MnBi2Te4 Devices with Engineered Geometric DefectsRemovePinyuan Wang, Jun Ge, Jiawei Luo, Xiaoqi Liu, Jiayi Yang, Fucong Fei, Fengqi Song, and Jian WangPhys. Rev. Lett. 137, 156601 (2026)
