Magnetization hysteresis and time decay measurements in FeSe0.50Te0.50: Evidence for fluctuation in mean free path induced pinningRemoveP. Das, Ajay D. Thakur, Anil K. Yadav, C. V. Tomy, M. R. Lees, G. Balakrishnan, S. Ramakrishnan, and A. K. GroverPhys. Rev. B 84, 214526 (2011)
