Cryogenic growth of aluminum: Structural morphology, optical properties, superconductivity, and microwave dielectric lossRemoveWilson J. Yánez-Parreño, Teun A. J. van Schijndel, Anthony P. McFadden, Kaixuan Ji, Susheng Tan, Yu Wu, Sergey Frolov, Stefan Zollner, Raymond W. Simmonds, and Christopher J. PalmstrømPhys. Rev. Materials 10, 044801 (2026)
