Error-resilient fast entangling gates for scalable ion-trap quantum processorsRemoveIsabelle Savill-Brown, Zain Mehdi, Alexander K. Ratcliffe, Varun D. Vaidya, Haonan Liu, Simon A. Haine, C. Ricardo Viteri, and Joseph J. HopePhys. Rev. A 113, 052610 (2026)
