Accounting for the length-scale dependence of thermal diffusivity in pristine and defect-rich 3C-SiC measured with transient thermal gratingsRemoveKeshav Vasudeva, Samuel Huberman, Angus P. C. Wylie, Maxwell Rae, Joey Demiane, Elena Botica-Artalejo, Emmanouil Trachanas, Jamal A. Haibeh, Kevin B. Woller, Michael P. Short, and Sara E. FerryPhys. Rev. Materials 10, 103602 (2026)
