Geometry-Dependent Dephasing in Small Metallic Wires

Phys. Rev. Lett. 86, 1821 – Published 26 February 2001
D. Natelson, R. L. Willett, K. W. West, and L. N. Pfeiffer

Abstract

Temperature dependent weak localization is measured in metallic nanowires in a previously unexplored size regime down to width w=5 nm. The dephasing time, τφ, shows a low temperature T dependence close to quasi-1D theoretical expectations ( τφT-2/3) in the narrowest wires, but exhibits a relative saturation as T0 for wide samples of the same material, as observed previously. As only sample geometry is varied to exhibit both suppression and divergence of τφ, this finding provides a new constraint on models of dephasing phenomena.

DOI: http://dx.doi.org/10.1103/PhysRevLett.86.1821

  • Received 19 June 2000
  • Published in the issue dated 26 February 2001

© 2001 The American Physical Society

Authors & Affiliations

D. Natelson, R. L. Willett, K. W. West, and L. N. Pfeiffer

  • Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974

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