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Formation of a rectifier with gold nanoclusters: X-ray reflectivity and atomic force microscopy measurements

Phys. Rev. B 71, 121404(R) – Published 24 March 2005
S. Pal, M. K. Sanyal, Neena S. John, and G. U. Kulkarni

Abstract

We demonstrate that monolayer and bilayer films of thiol-capped gold nanoclusters can exhibit prominent rectification properties, provided spatial asymmetry exists between the two tunnel junctions used to connect the nanoclusters. Systematic x-ray reflectivity and atomic force microscopy (AFM) measurements were carried out to characterize the spatial asymmetry introduced by a monolayer of fatty acid salt used to deposit thiol-capped gold nanoclusters on a hydrophilic SiO2-Si(001) substrate using the Langmuir–Blodgett technique. Current-voltage characteristics, obtained from conducting probe AFM measurements, show rectification ratios of 13.5 and 364.8 for the monolayer and bilayer films, respectively.

DOI: http://dx.doi.org/10.1103/PhysRevB.71.121404

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  • Received 4 January 2005
  • Revised 18 February 2005
  • Published 24 March 2005

© 2005 The American Physical Society

Authors & Affiliations

S. Pal and M. K. Sanyal

  • Surface Physics Division, Saha Institute of Nuclear Physics, 1/AF, Bidhannagar, Kolkata 700064, India

Neena S. John and G. U. Kulkarni

  • Chemistry and Physics of Materials Unit, Jawaharlal Nehru Center for Advanced Scientific Research, Jakkur, Bangalore-560064, India

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