This paper examines the effects of x rays on the plastic deformation of single crystals of II-VI semiconductors. It was found that x-ray excitation of CdTe, CdS, ZnS, and ZnSe causes significant hardening, with a decrease in the rate of plastic deformation up to two orders of magnitude, and an increase in the resolved shear stress up to 90%. The hardening is almost completely reversible. The dependencies of the phenomenon on the slip systems, plastic strain, and the current and voltage of the x-ray source are reported along with results on the x-ray conductivity and dislocation currents which were recorded simultaneously with the stress and strain diagrams. © 1996 The American Physical Society.
- Received 7 March 1996
- Published in the issue dated 15 June 1996
© 1996 The American Physical Society