Diffusion of individual Pt atoms on single-crystal surfaces of rhodium

Phys. Rev. B 48, 11305 – Published 15 October 1993
G. L. Kellogg


The diffusion of individual Pt atoms on five low-index crystal planes of Rh has been investigated by field-ion microscopy. The activation energy of surface diffusion is found to depend strongly on the crystal plane and to increase in the order of (111)<(311)<(110)<(331)<(100). It ranges from below 0.22 eV on Rh(111) to 0.92 eV on Rh(100). The diffusion mechanism on all surfaces is site-to-site hopping, with the exception of Rh(110), where convincing evidence for exchange displacements is obtained. The reflection barrier against migration off the plane edge also exhibits a strong structure sensitivity, from a large reflection on Rh(311) to essentially none on Rh(100) and Rh(331). The results are compared with previous field-ion-microscope studies of self-diffusion on Rh and Pt.

DOI: http://dx.doi.org/10.1103/PhysRevB.48.11305

  • Received 22 March 1993
  • Published in the issue dated 15 October 1993

© 1993 The American Physical Society

Authors & Affiliations

G. L. Kellogg

  • Sandia National Laboratories, Albuquerque, New Mexico 87112

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